TCAD based investigation of single event transient effect in double channel AlGaN/GaN HEMT
S Das, V Kumari, K Sehra, M Gupta, M Saxena
IEEE Transactions on Device and Materials Reliability 21 (3), 416-423
2021
Cited by 23
Shreyasi Das • Electrical Engineering, Indian Institute of Technology Bombay
Verified email at iitb.ac.in
S Das, V Kumari, K Sehra, M Gupta, M Saxena
IEEE Transactions on Device and Materials Reliability 21 (3), 416-423
S Das, V Kumari, K Sehra, M Gupta, M Saxena
Micro and Nanostructures 182, 207653
P Ganguly, S Das, A Chakrabarti, JY Siddiqui
IEEE Open Journal of Instrumentation and Measurement 3, 1-8
S Das, V Kumari, M Gupta, M Saxena
International Conference on Computers and Devices for Communication, 459-464
S Das, K Sehra, V Kumari, M Gupta, M Saxena
International Workshop on the Physics of Semiconductor and Devices, 127-140
P Ganguly, S Das, A Chakrabarti, JY Siddiqui
2024 IEEE Conference on Antenna Measurements and Applications (CAMA), 1-5